Commit message (Expand) | Author | Age | Files | Lines | |
---|---|---|---|---|---|
* | Adapt generic tests to model modified enum values scheme | Martin Odersky | 2017-04-04 | 5 | -21/+35 |
* | Add to test case | Martin Odersky | 2017-02-08 | 2 | -5/+20 |
* | ADT and Serialization test | Martin Odersky | 2017-02-08 | 8 | -0/+508 |